Phone: 02 9543 7377
                                                       Mobile: 0418 489 842
                                                       Fax: 02 9543 7366
                                                       Email: sales@alpe.net.au
                                                                        

 

Equipment : Ellipsometer

Ellipsometer | Ellipsometry

Ellipsometry measures a change in polarization as light reflects or transmits from a material structure. The polarization change is represented as an amplitude ratio, Ψ, and the phase difference, Δ. The measured response depends on optical properties and thickness of individual materials. Thus, ellipsometry is primarily used to determine film thickness and optical constants. However, it is also applied to characterize composition, crystallinity, roughness, doping concentration, and other material properties associated with a change in optical response.
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AccuMap-SE

AccuMap-SE


Characterizing thin film uniformity of large panels just got easier. The AccuMap-SE combines a high-speed M-2000 spectroscopic ellipsometer with fast mapping for large areas.

alpha-SE

alpha-SE


Spectroscopic Ellipsometry has never been easier! Simple, low cost system for measuring index and thickness. Spectral range of 380-900nm.

IR-VASE

IR-VASE


Covers a wide spectral range from 2 to 30 micronsThis ellipsometer is used to characterize both thin films and bulk materials..

M-2000 Ellipsometer

M-2000 Ellipsometer


Revolutionary rotating compensator technology. Many spectral ranges available from 193 to 1700nm.

RC2

RC2


The RC2® design builds on 20 years of experience. It combines the best features of previous models with innovative new technology.

Software

Software


The most powerful data acquisition and analysis software on the market

T-Solar

T-Solar


The T-Solar™ ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples.

VASE

VASE


Variable angle spectroscopic ellipsometer with wide spectral range of 193-2500nm.

VUV-VASE

VUV-VASE


Spectroscopic ellipsometer covering the vacuum UV to the NIR. Perfect for lithography applications at 248nm, 193nm, and 157nm.
 

Special Offer

We currently have demo equipment available for the Refractometers, Density Meter, Smartchem and SPE Autosampler.

What's New

18/11/2008

  DDM 2911 Density Meter is available for demonstration

We are pleased to announce that Steroglass STRIKE 300 Rotary Evaporator won the GOLD AWARD as the most innovative and well designed instrument in the world according the IBO magazine. They declare that "The Strike 300's innovative industrial design clearly distinguishes it by creating an appealing visual appearance and enhanced end-user experience."

 

Phone: 02 9543 7377
Mobile: 0418 489 842
Fax: 02 9543 7366
Email: sales@alpe.net.au

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